Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2022 IEEE International Instrumentation and Measurement Technology Conference
Publisher	Publ by IEEE
ISBN (Electronic)	978-1-6654-8360-5
DOIs	https://doi.org/10.1109/I2MTC48687.2022.9806594
Publication status	Published - 2022
Event	2022 IEEE International Instrumentation and Measurement Technology Conference : I2MTC 2022 - Ottawa, Canada Duration: 16 May 2022 → 19 May 2022

Conference	2022 IEEE International Instrumentation and Measurement Technology Conference
Abbreviated title	I2MTC 2022
Country/Territory	Canada
City	Ottawa
Period	16/05/22 → 19/05/22

Access to Document

@inproceedings{14ad0164279b475292b6accfe4443c7b,

title = "Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements",

author = "Johannes Handler and Paul O'Leary",

year = "2022",

doi = "10.1109/I2MTC48687.2022.9806594",

language = "English",

booktitle = "2022 IEEE International Instrumentation and Measurement Technology Conference",

publisher = "Publ by IEEE",

note = "2022 IEEE International Instrumentation and Measurement Technology Conference ; Conference date: 16-05-2022 Through 19-05-2022",

}

Handler, J & O'Leary, P 2022, Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. in 2022 IEEE International Instrumentation and Measurement Technology Conference. Publ by IEEE, 2022 IEEE International Instrumentation and Measurement Technology Conference , Ottawa, Quebec, Canada, 16/05/22. https://doi.org/10.1109/I2MTC48687.2022.9806594

TY - GEN

T1 - Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements

AU - Handler, Johannes

AU - O'Leary, Paul

PY - 2022

Y1 - 2022

U2 - 10.1109/I2MTC48687.2022.9806594

DO - 10.1109/I2MTC48687.2022.9806594

M3 - Conference contribution

BT - 2022 IEEE International Instrumentation and Measurement Technology Conference

PB - Publ by IEEE

T2 - 2022 IEEE International Instrumentation and Measurement Technology Conference

Y2 - 16 May 2022 through 19 May 2022

ER -