PCB drop test lifetime assessment based on simulations and cyclic bend tests

Peter Fuchs, Gerald Pinter, Zoltan Major

Research output: Contribution to journal › Article › Research › peer-review

11 Citations (Scopus)

Translated title of the contribution	PCB drop test lifetime assessment based on simulations and cyclic bend tests
Original language	English
Pages (from-to)	774-781
Journal	Microelectronics Reliability
Volume	53
Publication status	Published - 2013

Cite this

@article{e01fdb19d9c041b5910b84cd4cab2b0d,

title = "PCB drop test lifetime assessment based on simulations and cyclic bend tests",

author = "Peter Fuchs and Gerald Pinter and Zoltan Major",

year = "2013",

language = "English",

volume = "53",

pages = "774--781",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

}