Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

Mark Tratnig, Helmut Hlobil, Johann Reisinger, Paul O'Leary

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)
Original languageEnglish
Article number10
Pages (from-to)74-85
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Publication statusPublished - 21 Jul 2005
EventProceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII - San Jose, CA, United States
Duration: 17 Jan 200518 Jan 2005


  • Collineation
  • Light sectioning
  • Precision strip
  • Referencing
  • Strip inspection
  • Visual inspection

Cite this