Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

Mark Tratnig; Helmut Hlobil; Johann Reisinger; Paul O'Leary

doi:10.1117/12.586501

Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

Mark Tratnig
, Helmut Hlobil
, Johann Reisinger
, Paul O'Leary

Chair of Automation and Measurement (530)

Schienen GmbH

Research output: Contribution to journal › Conference article › peer-review

2 Citations (Scopus)

Original language	English
Article number	10
Pages (from-to)	74-85
Number of pages	12
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5679
DOIs	https://doi.org/10.1117/12.586501
Publication status	Published - 21 Jul 2005
Event	Proceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII - San Jose, CA, United States Duration: 17 Jan 2005 → 18 Jan 2005

Keywords

Collineation
Light sectioning
Precision strip
Referencing
Strip inspection
Visual inspection

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10.1117/12.586501

Cite this

@article{75c86cba9b84403eac24874892103641,

title = "Positional and orientational referencing of multiple light sectioning systems for precision profile measurement",

keywords = "Collineation, Light sectioning, Precision strip, Referencing, Strip inspection, Visual inspection",

author = "Mark Tratnig and Helmut Hlobil and Johann Reisinger and Paul O'Leary",

year = "2005",

month = jul,

day = "21",

doi = "10.1117/12.586501",

language = "English",

volume = "5679",

pages = "74--85",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Proceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII ; Conference date: 17-01-2005 Through 18-01-2005",

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TY - JOUR

T1 - Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

AU - Tratnig, Mark

AU - Hlobil, Helmut

AU - Reisinger, Johann

AU - O'Leary, Paul

PY - 2005/7/21

Y1 - 2005/7/21

KW - Collineation

KW - Light sectioning

KW - Precision strip

KW - Referencing

KW - Strip inspection

KW - Visual inspection

UR - https://www.scopus.com/pages/publications/21844474047

U2 - 10.1117/12.586501

DO - 10.1117/12.586501

M3 - Conference article

AN - SCOPUS:21844474047

SN - 0277-786X

VL - 5679

SP - 74

EP - 85

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

M1 - 10

T2 - Proceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII

Y2 - 17 January 2005 through 18 January 2005

ER -

Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

Keywords

Access to Document

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