Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

Edith Bucher; Christian Gspan; Ferdinand Hofer; Werner Sitte

Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

Edith Bucher
, Christian Gspan
, Ferdinand Hofer
, Werner Sitte

Chair of Physical Chemistry (480)

Research output: Contribution to journal › Article › Research › peer-review

35 Citations (Scopus)

Translated title of the contribution	Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy
Original language	English
Pages (from-to)	7-11
Journal	Solid State Ionics
Volume	230
Publication status	Published - 2013

Cite this

@article{9f6a72625e4b45b4b2cdbc816a13cbb2,

title = "Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy",

author = "Edith Bucher and Christian Gspan and Ferdinand Hofer and Werner Sitte",

year = "2013",

language = "English",

volume = "230",

pages = "7--11",

journal = "Solid State Ionics",

issn = "0167-2738",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

AU - Bucher, Edith

AU - Gspan, Christian

AU - Hofer, Ferdinand

AU - Sitte, Werner

PY - 2013

Y1 - 2013

M3 - Article

SN - 0167-2738

VL - 230

SP - 7

EP - 11

JO - Solid State Ionics

JF - Solid State Ionics

ER -