Rapid determination of stress factors and absolute residual stresses in thin films

K.J. Martinschitz, E. Eiper, S. Massl, Harald Köstenbauer, Rostislav Daniel, Gerardo Fontalvo, Christian Mitterer, Jozef Keckes

Research output: Contribution to journalArticleResearchpeer-review

16 Citations (Scopus)
Translated title of the contributionRapid determination of stress factors and absolute residual stresses in thin films
Original languageEnglish
Pages (from-to)777-783
JournalJournal of applied crystallography
Volume39
DOIs
Publication statusPublished - 2006

Cite this