Rapid determination of stress factors and absolute residual stresses in thin films

K.J. Martinschitz; E. Eiper; S. Massl; Harald Köstenbauer; Rostislav Daniel; Gerardo Fontalvo; Christian Mitterer; Jozef Keckes

doi:10.1107/S002188980603322X

Rapid determination of stress factors and absolute residual stresses in thin films

K.J. Martinschitz
, E. Eiper
, S. Massl
, Harald Köstenbauer
, Rostislav Daniel
, Gerardo Fontalvo
, Christian Mitterer
, Jozef Keckes

Chair of Materials Physics (430)

Research output: Contribution to journal › Article › Research › peer-review

16 Citations (Scopus)

Translated title of the contribution	Rapid determination of stress factors and absolute residual stresses in thin films
Original language	English
Pages (from-to)	777-783
Journal	Journal of applied crystallography
Volume	39
DOIs	https://doi.org/10.1107/S002188980603322X
Publication status	Published - 2006

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10.1107/S002188980603322X

Cite this

@article{643139a5e9804ef0b8b5e2a8f5c16e85,

title = "Rapid determination of stress factors and absolute residual stresses in thin films",

author = "K.J. Martinschitz and E. Eiper and S. Massl and Harald K{\"o}stenbauer and Rostislav Daniel and Gerardo Fontalvo and Christian Mitterer and Jozef Keckes",

year = "2006",

doi = "10.1107/S002188980603322X",

language = "English",

volume = "39",

pages = "777--783",

journal = "Journal of applied crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

}

TY - JOUR

T1 - Rapid determination of stress factors and absolute residual stresses in thin films

AU - Martinschitz, K.J.

AU - Eiper, E.

AU - Massl, S.

AU - Köstenbauer, Harald

AU - Daniel, Rostislav

AU - Fontalvo, Gerardo

AU - Mitterer, Christian

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

U2 - 10.1107/S002188980603322X

DO - 10.1107/S002188980603322X

M3 - Article

SN - 0021-8898

VL - 39

SP - 777

EP - 783

JO - Journal of applied crystallography

JF - Journal of applied crystallography

ER -