Rapid determination of stress factors and residual stresses in anisotropic thin films

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contributionRapid determination of stress factors and residual stresses in anisotropic thin films
Original languageEnglish
Publication statusPublished - 2006
Event55th Annual Denver X-ray Conference - Denver, United States
Duration: 7 Aug 2006 → 11 Aug 2006

Conference

Conference55th Annual Denver X-ray Conference
Country/TerritoryUnited States
CityDenver
Period7/08/06 → 11/08/06

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