Residual stress profile determined by piezo-spectroscopy in alumina/alumina-zirconia layers separated by a compositionally graded intermediate layer

Mónica Popa, José M Calderón Moreno, Pavol Hvizdoš, Raúl Bermejo, Guy Anne

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

2 Citations (Scopus)
Original languageEnglish
Title of host publicationKey engineering materials
Pages328-331
Number of pages4
Volume290
DOIs
Publication statusPublished - 1 Dec 2005
Externally publishedYes

Publication series

NameKey engineering materials
PublisherTrans Tech Publications
ISSN (Print)1013-9826

Keywords

  • Compositionally graded layer
  • Cr fluorescence
  • Electrophoretic deposition
  • Piezo-spectroscopy
  • Residual stress
  • Ruby R-line luminiscence
  • Zirconia-alumina layered composites

Cite this