Skip to main navigation Skip to search Skip to main content

Residual stress profile determined by piezo-spectroscopy in alumina/alumina-zirconia layers separated by a compositionally graded intermediate layer

  • Mónica Popa
  • , José M Calderón Moreno
  • , Pavol Hvizdoš
  • , Raúl Bermejo
  • , Guy Anne
  • Universidad Politecnica de Catalunya
  • Université Catholique de Louvain

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

2 Citations (Scopus)
Original languageEnglish
Title of host publicationKey engineering materials
Pages328-331
Number of pages4
Volume290
DOIs
Publication statusPublished - 1 Dec 2005
Externally publishedYes

Publication series

NameKey engineering materials
PublisherTrans Tech Publications
ISSN (Print)1013-9826

Keywords

  • Compositionally graded layer
  • Cr fluorescence
  • Electrophoretic deposition
  • Piezo-spectroscopy
  • Residual stress
  • Ruby R-line luminiscence
  • Zirconia-alumina layered composites

Cite this