Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems

Ruth Konetschnik, Darjan Kozic, Ronald Schöngrundner, Hans Peter Ganser, Roland Brunner, Daniel Kiener

Research output: Contribution to conference › Presentation › Research › peer-review

Original language	English
Publication status	Published - 15 Mar 2016
Event	AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM - Saarbrücken, Germany Duration: 14 Mar 2016 → 15 Mar 2016

Conference	AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM
Country/Territory	Germany
City	Saarbrücken
Period	14/03/16 → 15/03/16

Cite this

@conference{5662ff84dd16437cb5a6ce81a1b6d043,

title = "Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems",

author = "Ruth Konetschnik and Darjan Kozic and Ronald Sch{\"o}ngrundner and Ganser, {Hans Peter} and Roland Brunner and Daniel Kiener",

year = "2016",

month = mar,

day = "15",

language = "English",

note = "AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM ; Conference date: 14-03-2016 Through 15-03-2016",

}

TY - CONF

T1 - Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems

AU - Konetschnik, Ruth

AU - Kozic, Darjan

AU - Schöngrundner, Ronald

AU - Ganser, Hans Peter

AU - Brunner, Roland

AU - Kiener, Daniel

PY - 2016/3/15

Y1 - 2016/3/15

M3 - Presentation

T2 - AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM

Y2 - 14 March 2016 through 15 March 2016

ER -