Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods

Klaus-Jürgen Martinschitz, Ernst Eiper, Jozef Keckes

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods
Original language	English
Publication status	Published - 2006
Event	Gordon Research Conference on thin film & small scale mechanical behavior - Waterville, United States Duration: 30 Jul 2006 → 4 Aug 2006

Conference	Gordon Research Conference on thin film & small scale mechanical behavior
Country/Territory	United States
City	Waterville
Period	30/07/06 → 4/08/06

Cite this

@conference{238325088ad9414e99fd9cc3ed5b3dc7,

title = "Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods",

author = "Klaus-J{\"u}rgen Martinschitz and Ernst Eiper and Jozef Keckes",

year = "2006",

language = "English",

note = "Gordon Research Conference on thin film & small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",

}

Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods. / Martinschitz, Klaus-Jürgen; Eiper, Ernst; Keckes, Jozef.
2006. Poster session presented at Gordon Research Conference on thin film & small scale mechanical behavior, Waterville, Maine, United States.

Research output: Contribution to conference › Poster › Research › peer-review