Resonant magnetic X-ray scattering at the lanthanide M5 edges

E. Weschke; Holger Ott; E. Schierle; C. Schüßler-Langeheine; G. Kaindl; V. Leiner; H. Zabel

doi:10.1016/j.physb.2004.11.012

Resonant magnetic X-ray scattering at the lanthanide M₅ edges

E. Weschke
, Holger Ott
, E. Schierle
, C. Schüßler-Langeheine
, G. Kaindl
, V. Leiner
, H. Zabel

Freie Universität Berlin
Universität zu Köln, Institut für theoretische Physik
Ruhr-Universität Bochum

Research output: Contribution to journal › Article › Research › peer-review

Abstract

Magnetic soft X-ray scattering at the Ho M5 resonance was characterized using thin films, thus reducing the effect of the strong photon absorption. Magnetic scattering factors are found to be as large as 200r0 at resonance, while the effective probing depth of the X-rays at the resonance maximum is of the order of 30 Å at 2θ=25°. The huge enhancement of magnetic scattering allows one to study ultrathin Ho films, which is exploited to investigate the thickness dependence of the Néel temperature in these long-period antiferromagnets. The tunable X-ray penetration depth across the resonance can be used for magnetic depth profiling, e.g. to study the depth-dependent growth of antiferromagnetic domains across the ferromagnetic/antiferromagnetic phase transition in Dy metal films.

Original language	English
Pages (from-to)	16-21
Number of pages	6
Journal	Physica B: Condensed Matter
Volume	2005
Issue number	Volume 357, Issues 1–2
DOIs	https://doi.org/10.1016/j.physb.2004.11.012
Publication status	Published - 28 Feb 2005
Externally published	Yes

Keywords

Finite-size scaling
Lanthanides
Optical constants
Resonant magnetic X-ray scattering

Access to Document

10.1016/j.physb.2004.11.012

Cite this

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title = "Resonant magnetic X-ray scattering at the lanthanide M5 edges",

abstract = "Magnetic soft X-ray scattering at the Ho M5 resonance was characterized using thin films, thus reducing the effect of the strong photon absorption. Magnetic scattering factors are found to be as large as 200r0 at resonance, while the effective probing depth of the X-rays at the resonance maximum is of the order of 30 {\AA} at 2θ=25°. The huge enhancement of magnetic scattering allows one to study ultrathin Ho films, which is exploited to investigate the thickness dependence of the N{\'e}el temperature in these long-period antiferromagnets. The tunable X-ray penetration depth across the resonance can be used for magnetic depth profiling, e.g. to study the depth-dependent growth of antiferromagnetic domains across the ferromagnetic/antiferromagnetic phase transition in Dy metal films.",

keywords = "Finite-size scaling, Lanthanides, Optical constants, Resonant magnetic X-ray scattering",

author = "E. Weschke and Holger Ott and E. Schierle and C. Sch{\"u}{\ss}ler-Langeheine and G. Kaindl and V. Leiner and H. Zabel",

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T1 - Resonant magnetic X-ray scattering at the lanthanide M5 edges

AU - Weschke, E.

AU - Ott, Holger

AU - Schierle, E.

AU - Schüßler-Langeheine, C.

AU - Kaindl, G.

AU - Leiner, V.

AU - Zabel, H.

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Y1 - 2005/2/28

N2 - Magnetic soft X-ray scattering at the Ho M5 resonance was characterized using thin films, thus reducing the effect of the strong photon absorption. Magnetic scattering factors are found to be as large as 200r0 at resonance, while the effective probing depth of the X-rays at the resonance maximum is of the order of 30 Å at 2θ=25°. The huge enhancement of magnetic scattering allows one to study ultrathin Ho films, which is exploited to investigate the thickness dependence of the Néel temperature in these long-period antiferromagnets. The tunable X-ray penetration depth across the resonance can be used for magnetic depth profiling, e.g. to study the depth-dependent growth of antiferromagnetic domains across the ferromagnetic/antiferromagnetic phase transition in Dy metal films.

AB - Magnetic soft X-ray scattering at the Ho M5 resonance was characterized using thin films, thus reducing the effect of the strong photon absorption. Magnetic scattering factors are found to be as large as 200r0 at resonance, while the effective probing depth of the X-rays at the resonance maximum is of the order of 30 Å at 2θ=25°. The huge enhancement of magnetic scattering allows one to study ultrathin Ho films, which is exploited to investigate the thickness dependence of the Néel temperature in these long-period antiferromagnets. The tunable X-ray penetration depth across the resonance can be used for magnetic depth profiling, e.g. to study the depth-dependent growth of antiferromagnetic domains across the ferromagnetic/antiferromagnetic phase transition in Dy metal films.

KW - Finite-size scaling

KW - Lanthanides

KW - Optical constants

KW - Resonant magnetic X-ray scattering

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