Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers

C. Schüßler-Langeheine; E. Weschke; A. Yu Grigoriev; H. Ott; R. Meier; D. V. Vyalikh; Chandan Mazumdar; C. Sutter; D. Abernathy; G. Grübel; G. Kaindl

doi:10.1016/S0368-2048(00)00318-2

Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers

C. Schüßler-Langeheine, E. Weschke, A. Yu Grigoriev, H. Ott, R. Meier, D. V. Vyalikh, Chandan Mazumdar, C. Sutter, D. Abernathy, G. Grübel, G. Kaindl

Chair of Reservoir Engineering (570)

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	953-957
Number of pages	5
Journal	Journal of electron spectroscopy and related phenomena
Volume	114-116
DOIs	https://doi.org/10.1016/S0368-2048(00)00318-2
Publication status	Published - Mar 2001
Event	8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) - Berkeley, CA, USA Duration: 8 Aug 2000 → 12 Aug 2000

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Schüßler-Langeheine, C., Weschke, E., Grigoriev, A. Y., Ott, H., Meier, R., Vyalikh, D. V., Mazumdar, C., Sutter, C., Abernathy, D., Grübel, G., & Kaindl, G. (2001). Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers. Journal of electron spectroscopy and related phenomena, 114-116, 953-957. https://doi.org/10.1016/S0368-2048(00)00318-2

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title = "Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers",

author = "C. Sch{\"u}{\ss}ler-Langeheine and E. Weschke and Grigoriev, {A. Yu} and H. Ott and R. Meier and Vyalikh, {D. V.} and Chandan Mazumdar and C. Sutter and D. Abernathy and G. Gr{\"u}bel and G. Kaindl",

year = "2001",

month = mar,

doi = "10.1016/S0368-2048(00)00318-2",

language = "English",

volume = "114-116",

pages = "953--957",

journal = "Journal of electron spectroscopy and related phenomena",

issn = "0368-2048",

publisher = "Elsevier B.V.",

note = "8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) ; Conference date: 08-08-2000 Through 12-08-2000",

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Schüßler-Langeheine, C, Weschke, E, Grigoriev, AY, Ott, H, Meier, R, Vyalikh, DV, Mazumdar, C, Sutter, C, Abernathy, D, Grübel, G & Kaindl, G 2001, 'Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers', Journal of electron spectroscopy and related phenomena, vol. 114-116, pp. 953-957. https://doi.org/10.1016/S0368-2048(00)00318-2

TY - JOUR

T1 - Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers

AU - Schüßler-Langeheine, C.

AU - Weschke, E.

AU - Grigoriev, A. Yu

AU - Ott, H.

AU - Meier, R.

AU - Vyalikh, D. V.

AU - Mazumdar, Chandan

AU - Sutter, C.

AU - Abernathy, D.

AU - Grübel, G.

AU - Kaindl, G.

PY - 2001/3

Y1 - 2001/3

UR - http://www.scopus.com/inward/record.url?scp=0343462259&partnerID=8YFLogxK

U2 - 10.1016/S0368-2048(00)00318-2

DO - 10.1016/S0368-2048(00)00318-2

M3 - Conference article

AN - SCOPUS:0343462259

SN - 0368-2048

VL - 114-116

SP - 953

EP - 957

JO - Journal of electron spectroscopy and related phenomena

JF - Journal of electron spectroscopy and related phenomena

T2 - 8th International Conference on Electronic Spectroscopy and Structure (ICESS-8)

Y2 - 8 August 2000 through 12 August 2000

ER -

Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers

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