Translated title of the contribution | Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing |
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Original language | English |
Pages (from-to) | 343-355 |
Journal | Practical metallography = Praktische Metallographie |
Volume | 49 |
Publication status | Published - 2012 |
Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing
Gabriele Moser, Herwig Felber, Boryana Rashkova, Peter J. Imrich, Christoph Kirchlechner, Wolfgang Grosinger, C. Motz, Gerhard Dehm, Daniel Kiener
Research output: Contribution to journal › Article › Research › peer-review
21
Citations
(Scopus)