Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing

Gabriele Moser; Herwig Felber; Boryana Rashkova; Peter J. Imrich; Christoph Kirchlechner; Wolfgang Grosinger; C. Motz; Gerhard Dehm; Daniel Kiener

Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing

Gabriele Moser
, Herwig Felber
, Boryana Rashkova
, Peter J. Imrich
, Christoph Kirchlechner
, Wolfgang Grosinger
, C. Motz
, Gerhard Dehm
, Daniel Kiener

Research output: Contribution to journal › Article › Research › peer-review

21 Citations (Scopus)

Translated title of the contribution	Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing
Original language	English
Pages (from-to)	343-355
Journal	Practical metallography = Praktische Metallographie
Volume	49
Publication status	Published - 2012

Cite this

@article{f507cdbd89c74dfb964c616fd9ea6bc3,

title = "Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing",

author = "Gabriele Moser and Herwig Felber and Boryana Rashkova and Imrich, \{Peter J.\} and Christoph Kirchlechner and Wolfgang Grosinger and C. Motz and Gerhard Dehm and Daniel Kiener",

year = "2012",

language = "English",

volume = "49",

pages = "343--355",

journal = "Practical metallography = Praktische Metallographie",

issn = "0032-678X",

publisher = "Walter de Gruyter GmbH",

}

TY - JOUR

T1 - Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing

AU - Moser, Gabriele

AU - Felber, Herwig

AU - Rashkova, Boryana

AU - Imrich, Peter J.

AU - Kirchlechner, Christoph

AU - Grosinger, Wolfgang

AU - Motz, C.

AU - Dehm, Gerhard

AU - Kiener, Daniel

PY - 2012

Y1 - 2012

M3 - Article

SN - 0032-678X

VL - 49

SP - 343

EP - 355

JO - Practical metallography = Praktische Metallographie

JF - Practical metallography = Praktische Metallographie

ER -