Scanning electron microscope: An essential equipment of failure analysis

  • Michael Panzenböck
  • , Caroline Freitag
  • , Gerhard Hawranek
  • , Francisca Mendez Martin
  • , Boryana Rashkova

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2018
EventMicroscopy & Microanalysis - Baltimore, United States
Duration: 5 Aug 20189 Aug 2018

Conference

ConferenceMicroscopy & Microanalysis
Country/TerritoryUnited States
CityBaltimore
Period5/08/189/08/18

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