Scanning Probe Microscopy-based Characterization of ZnO Nanorods

Christian Teichert, Yue Hou, Igor Beinik, Yinyi Chen, A. Djuricis, W. Anwand, G. Brauer

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Translated title of the contribution	Scanning Probe Microscopy-based Characterization of ZnO Nanorods
Original language	English
Title of host publication	Abstract CD IEEE International NanoElectronics Conference (INEC 2010)
Pages	438-439
Publication status	Published - 2010

Cite this

@inproceedings{ac905615f2844b3a881e95f737bb388b,

title = "Scanning Probe Microscopy-based Characterization of ZnO Nanorods",

author = "Christian Teichert and Yue Hou and Igor Beinik and Yinyi Chen and A. Djuricis and W. Anwand and G. Brauer",

year = "2010",

language = "English",

pages = "438--439",

booktitle = "Abstract CD IEEE International NanoElectronics Conference (INEC 2010)",

}