| Translated title of the contribution | Sekundärionen-Massensprektroskopie (SIMS) mittels FIB |
|---|---|
| Original language | German |
| Title of host publication | Handbuch der Nanoanalytik |
| Pages | 199-200 |
| Publication status | Published - 2005 |
Sekundärionen-Massensprektroskopie (SIMS) mittels FIB
Christian Motz, Daniel Kiener, Thomas Schöberl, Reinhard Pippan, Gerhard Dehm
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research