Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Ernst Eiper, Klaus Jürgen Martinschitz, Gerhard Dehm, Jozef Keckes

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionSize effect in metallic thin films characterized by low-temperature X-ray diffraction
Original languageEnglish
Publication statusPublished - 2006
Event55th Annual Denver X-ray Conference - Denver, United States
Duration: 7 Aug 200611 Aug 2006

Conference

Conference55th Annual Denver X-ray Conference
Country/TerritoryUnited States
CityDenver
Period7/08/0611/08/06

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