Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Ernst Eiper, Klaus Jürgen Martinschitz, Gerhard Dehm, Jozef Keckes

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Size effect in metallic thin films characterized by low-temperature X-ray diffraction
Original language	English
Publication status	Published - 2006
Event	55th Annual Denver X-ray Conference - Denver, United States Duration: 7 Aug 2006 → 11 Aug 2006

Conference	55th Annual Denver X-ray Conference
Country/Territory	United States
City	Denver
Period	7/08/06 → 11/08/06

Cite this

@conference{44982903b085460c804c4c43db421f5b,

title = "Size effect in metallic thin films characterized by low-temperature X-ray diffraction",

author = "Ernst Eiper and Martinschitz, {Klaus J{\"u}rgen} and Gerhard Dehm and Jozef Keckes",

year = "2006",

language = "English",

note = "55th Annual Denver X-ray Conference ; Conference date: 07-08-2006 Through 11-08-2006",

}