Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy

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Translated title of the contribution	Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy
Original language	English
Pages (from-to)	1328-1337
Journal	Acta materialia
Volume	59
DOIs	https://doi.org/10.1016/j.actamat.2010.10.065
Publication status	Published - 2011

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@article{9233e56ff15943ad8861aacb709661aa,

title = "Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy",

author = "Daniel Kiener and Minor, \{Andrew M.\}",

year = "2011",

doi = "10.1016/j.actamat.2010.10.065",

language = "English",

volume = "59",

pages = "1328--1337",

journal = "Acta materialia",

issn = "1359-6454",

publisher = "Acta Materialia Inc",

}