Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
Original language	English
Publication status	Published - 2008
Event	Intel European Research and Innovation Conference - Leixlip, Ireland Duration: 10 Sept 2008 → 12 Sept 2008

Conference	Intel European Research and Innovation Conference
Country/Territory	Ireland
City	Leixlip
Period	10/09/08 → 12/09/08

Cite this

@conference{d69d8edc65424033a3629a94743377d5,

title = "Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz",

author = "Paloma Tejedor and Luis V{\'a}zquez and Laura D{\'i}ez-Merino and Igor Beinik and Christian Teichert",

year = "2008",

language = "English",

note = "Intel European Research and Innovation Conference ; Conference date: 10-09-2008 Through 12-09-2008",

}

Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz. / Tejedor, Paloma; Vázquez, Luis; Díez-Merino, Laura et al.
2008. Poster session presented at Intel European Research and Innovation Conference, Leixlip, Ireland.

Research output: Contribution to conference › Poster › Research › peer-review

TY - CONF

T1 - Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz

AU - Tejedor, Paloma

AU - Vázquez, Luis

AU - Díez-Merino, Laura

AU - Beinik, Igor

AU - Teichert, Christian

PY - 2008

Y1 - 2008

M3 - Poster

T2 - Intel European Research and Innovation Conference

Y2 - 10 September 2008 through 12 September 2008

ER -