Spectroscopy of stripe order in La1.8Sr0.2NiO4 using resonant soft X-ray diffraction

C. Schüßler-Langeheine; J. Schlappa; A. Tanaka; Z. Hu; C. F. Chang; E. Schierle; M. Benomar; H. Ott; E. Weschke; G. Kaindl; O. Friedt; G. A. Sawatzky; H. J. Lin; C. T. Chen; M. Braden; L. H. Tjeng

doi:10.1103/PhysRevLett.95.156402

Spectroscopy of stripe order in La1.8Sr0.2NiO4 using resonant soft X-ray diffraction

C. Schüßler-Langeheine, J. Schlappa, A. Tanaka, Z. Hu, C. F. Chang, E. Schierle, M. Benomar, H. Ott, E. Weschke, G. Kaindl, O. Friedt, G. A. Sawatzky, H. J. Lin, C. T. Chen, M. Braden, L. H. Tjeng

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Article number	156402
Journal	Physical review letters
Volume	95
Issue number	15
DOIs	https://doi.org/10.1103/PhysRevLett.95.156402
Publication status	Published - 7 Oct 2005

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10.1103/PhysRevLett.95.156402

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Schüßler-Langeheine, C., Schlappa, J., Tanaka, A., Hu, Z., Chang, C. F., Schierle, E., Benomar, M., Ott, H., Weschke, E., Kaindl, G., Friedt, O., Sawatzky, G. A., Lin, H. J., Chen, C. T., Braden, M., & Tjeng, L. H. (2005). Spectroscopy of stripe order in La1.8Sr0.2NiO4 using resonant soft X-ray diffraction. Physical review letters, 95(15), Article 156402. https://doi.org/10.1103/PhysRevLett.95.156402

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title = "Spectroscopy of stripe order in La1.8Sr0.2NiO4 using resonant soft X-ray diffraction",

author = "C. Sch{\"u}{\ss}ler-Langeheine and J. Schlappa and A. Tanaka and Z. Hu and Chang, {C. F.} and E. Schierle and M. Benomar and H. Ott and E. Weschke and G. Kaindl and O. Friedt and Sawatzky, {G. A.} and Lin, {H. J.} and Chen, {C. T.} and M. Braden and Tjeng, {L. H.}",

year = "2005",

month = oct,

day = "7",

doi = "10.1103/PhysRevLett.95.156402",

language = "English",

volume = "95",

journal = "Physical review letters",

issn = "0031-9007",

publisher = "American Physical Society",

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Schüßler-Langeheine, C, Schlappa, J, Tanaka, A, Hu, Z, Chang, CF, Schierle, E, Benomar, M, Ott, H, Weschke, E, Kaindl, G, Friedt, O, Sawatzky, GA, Lin, HJ, Chen, CT, Braden, M & Tjeng, LH 2005, 'Spectroscopy of stripe order in La1.8Sr0.2NiO4 using resonant soft X-ray diffraction', Physical review letters, vol. 95, no. 15, 156402. https://doi.org/10.1103/PhysRevLett.95.156402

TY - JOUR

T1 - Spectroscopy of stripe order in La1.8Sr0.2NiO4 using resonant soft X-ray diffraction

AU - Schüßler-Langeheine, C.

AU - Schlappa, J.

AU - Tanaka, A.

AU - Hu, Z.

AU - Chang, C. F.

AU - Schierle, E.

AU - Benomar, M.

AU - Ott, H.

AU - Weschke, E.

AU - Kaindl, G.

AU - Friedt, O.

AU - Sawatzky, G. A.

AU - Lin, H. J.

AU - Chen, C. T.

AU - Braden, M.

AU - Tjeng, L. H.

PY - 2005/10/7

Y1 - 2005/10/7

UR - http://www.scopus.com/inward/record.url?scp=28944440597&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.95.156402

DO - 10.1103/PhysRevLett.95.156402

M3 - Article

AN - SCOPUS:28944440597

SN - 0031-9007

VL - 95

JO - Physical review letters

JF - Physical review letters

IS - 15

M1 - 156402

ER -

Spectroscopy of stripe order in La1.8Sr0.2NiO4 using resonant soft X-ray diffraction

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