Translated title of the contribution | Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN |
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Original language | English |
Title of host publication | Proceeding of International Conference on Microscopy of Semiconducting Materials 2011 |
Pages | 1-4 |
DOIs | |
Publication status | Published - 2011 |
Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN
M. Petrov, David Holec, L. Lymperakis, J Neugebauer, C.J. Humphreys
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1
Citation
(Scopus)