Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods

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Translated title of the contribution	Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods
Original language	English
Pages (from-to)	711-715
Journal	Materials Science Forum
Volume	524-525
Publication status	Published - 2006

Cite this

@article{52ba54d4c8ed4493a8478cf4ba27df67,

title = "Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods",

author = "Klaus-J{\"u}rgen Martinschitz and Ernst Eiper and Jozef Keckes",

year = "2006",

language = "English",

volume = "524-525",

pages = "711--715",

journal = "Materials Science Forum ",

issn = "0255-5476",

publisher = "Trans Tech Publications",

}