Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction
Original language	English
Publication status	Published - 2012
Event	9th International Conference on Residual Stresses, ICRS 2012 - Garmisch-Partenkirchen, Austria Duration: 7 Oct 2012 → 9 Oct 2012

Conference	9th International Conference on Residual Stresses, ICRS 2012
Country/Territory	Austria
City	Garmisch-Partenkirchen
Period	7/10/12 → 9/10/12

Cite this

@conference{37b8bee8b3664aa5beb9ba5d9bd1385b,

title = "Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction",

author = "Rostislav Daniel and Jozef Keckes and Christian Mitterer",

year = "2012",

language = "English",

note = "9th International Conference on Residual Stresses, ICRS 2012 ; Conference date: 07-10-2012 Through 09-10-2012",

}