Temperature dependent bais-stress measurement in organic thin film Transistors

Translated title of the contribution: Temperature dependent bais-stress measurement in organic thin film Transistors

T. Obermüller, M. Marchl, S.J. Ausserlechner, A. W. Golubkov, A. Haase, B. Stadlober, L. Hauser, G. Trimmel, Matthias Edler, Thomas Grießer, Wolfgang Kern, E. Zojer

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionTemperature dependent bais-stress measurement in organic thin film Transistors
Original languageGerman
Publication statusPublished - 2009
EventInternational Conference on Organic Electronics 2009 - University of Liverpool, Liverpool, United Kingdom
Duration: 15 Jun 200917 Jun 2009

Conference

ConferenceInternational Conference on Organic Electronics 2009
Country/TerritoryUnited Kingdom
CityLiverpool
Period15/06/0917/06/09

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