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Temperature dependent bais-stress measurement in organic thin film Transistors

Translated title of the contribution: Temperature dependent bais-stress measurement in organic thin film Transistors
  • T. Obermüller
  • , M. Marchl
  • , S.J. Ausserlechner
  • , A. W. Golubkov
  • , A. Haase
  • , B. Stadlober
  • , L. Hauser
  • , G. Trimmel
  • , Matthias Edler
  • , Thomas Grießer
  • , Wolfgang Kern
  • , E. Zojer

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionTemperature dependent bais-stress measurement in organic thin film Transistors
Original languageGerman
Publication statusPublished - 2009
EventInternational Conference on Organic Electronics 2009 - University of Liverpool, Liverpool, United Kingdom
Duration: 15 Jun 200917 Jun 2009

Conference

ConferenceInternational Conference on Organic Electronics 2009
Country/TerritoryUnited Kingdom
CityLiverpool
Period15/06/0917/06/09

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