Translated title of the contribution | Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction |
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Original language | English |
Pages (from-to) | 765-766 |
Journal | Acta materialia |
Volume | 55 |
Publication status | Published - 2007 |
Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction
Petra Sonnweber-Ribic, P. Gruber, Gerhard Dehm, Eduard Arzt
Research output: Contribution to journal › Article › Research › peer-review
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(Scopus)