Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction

Petra Sonnweber-Ribic, P. Gruber, Gerhard Dehm, Eduard Arzt

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Translated title of the contributionTexture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction
Original languageEnglish
Pages (from-to)765-766
JournalActa materialia
Volume55
Publication statusPublished - 2007

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