Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction

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Translated title of the contribution	Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction
Original language	English
Pages (from-to)	765-766
Journal	Acta materialia
Volume	55
Publication status	Published - 2007

Cite this

@article{b99dd66e58d646b698df57b5bc1a1dec,

title = "Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction",

author = "Petra Sonnweber-Ribic and P. Gruber and Gerhard Dehm and Eduard Arzt",

year = "2007",

language = "English",

volume = "55",

pages = "765--766",

journal = "Acta materialia",

issn = "1359-6454",

}