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Thermography and complementary measurements as tools to detect micro-irregularities in electronic components

  • Materials Center Leoben Forschungs GmbH
  • Epcos OHG

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)255-260
Number of pages6
JournalJournal of ceramic science and technology
Volume6
Issue number4
DOIs
Publication statusPublished - Dec 2015

Keywords

  • Electroceramics
  • Focused ion beam
  • Inhomogeneities
  • LTCC
  • Microthermography
  • PTC

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