TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

J. Schnöller, Robert Franz, Christian Mitterer, H. Hutter

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7 Citations (Scopus)
Translated title of the contributionTOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings
Original languageEnglish
Pages (from-to)1857-1861
JournalAnalytical and bioanalytical chemistry
DOIs
Publication statusPublished - 2009

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