TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

J. Schnöller, Robert Franz, Christian Mitterer, H. Hutter

Research output: Contribution to journal › Article › Research › peer-review

7 Citations (Scopus)

Translated title of the contribution	TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings
Original language	English
Pages (from-to)	1857-1861
Journal	Analytical and bioanalytical chemistry
DOIs	https://doi.org/10.1007/sO0216-008-2525-7
Publication status	Published - 2009

Access to Document

@article{9c13e57682f44318b4dce3386c8a356b,

title = "TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings",

author = "J. Schn{\"o}ller and Robert Franz and Christian Mitterer and H. Hutter",

year = "2009",

doi = "10.1007/sO0216-008-2525-7",

language = "English",

pages = "1857--1861",

journal = "Analytical and bioanalytical chemistry",

issn = "1618-2642",

publisher = "Springer Science and Business Media Deutschland GmbH",

}

TY - JOUR

T1 - TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

AU - Schnöller, J.

AU - Franz, Robert

AU - Mitterer, Christian

AU - Hutter, H.

PY - 2009

Y1 - 2009

U2 - 10.1007/sO0216-008-2525-7

DO - 10.1007/sO0216-008-2525-7

M3 - Article

SN - 1618-2642

SP - 1857

EP - 1861

JO - Analytical and bioanalytical chemistry

JF - Analytical and bioanalytical chemistry

ER -