Topography effects in AFM force mapping experiments on xylan-decorated cellulose thin films

Christian Ganser, Katrin Niegelhell, Caterina Marina Czibula, Angela Chemelli, Christian Teichert, Robert Schennach, Stefan Spirk

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5 Citations (Scopus)


Xylan-coated cellulose thin films has been investigated by means of atomic force microscopy (AFM) and force mapping experiments. The birch xylan deposition on the film was performed under control by means of a multiple parameter surface plasmon resonance spectroscopy (MP-SPR) under dynamic conditions. The coated films were submitted to AFM in phase imaging mode to force mapping with modified AFM tips (sensitive to hydrophilic OH and hydrophobic CH3 groups) in order to characterize and localize the xylan on the surfaces. At the first glance, a clear difference in the adhesion force between xylan-coated areas and cellulose has been observed. However, these different adhesion forces originate from topography effects, which prevent an unambiguous identification and subsequent localization of the xylan on the cellulosic surfaces.
Original languageEnglish
Pages (from-to)1115-1123
JournalHolzforschung : international journal of the biology, chemistry, physics and technology of wood
Issue number12
Publication statusE-pub ahead of print - 8 Aug 2016

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