Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis

Manfred Wiessner, Paul Angerer, Sybrand van der Zwaag, Ernst Gamsjäger

Research output: Contribution to journalArticleResearchpeer-review

1 Citation (Scopus)
Original languageEnglish
Article number110860
Number of pages9
JournalMaterials characterization
Issue numberFebruary
Publication statusPublished - 25 Dec 2020


  • Bayesian statistics
  • Dislocation densities
  • Levenberg-Marquardt
  • Markov Chain Monte Carlo
  • Rietveld method
  • Stainless steels

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