X-ray based tools for the investigation of buried interfaces in organic electronic devices

Alfred Neuhold, Hannes Brandner, Simon J. Ausserlechner, Stefan Lorbek, Markus Neuschitzer, Egbert Zojer, Christian Teichert, Roland Resel

Research output: Contribution to journalArticleResearchpeer-review

12 Citations (Scopus)
Translated title of the contributionX-ray based tools for the investigation of buried interfaces in organic electronic devices
Original languageEnglish
Pages (from-to)479-487
JournalOrganic electronics
Volume14
DOIs
Publication statusPublished - 2013

Cite this