X-ray characterization of semiconductor nanostructures

Vaclav Holy, Maja Buljan, Rainer T. Lechner

Research output: Contribution to journalArticleResearchpeer-review

1 Citation (Scopus)
Translated title of the contributionX-ray characterization of semiconductor nanostructures
Original languageEnglish
Pages (from-to)064002/1- 064002/7
JournalSemiconductor science and technology
Volume26
DOIs
Publication statusPublished - 2011

Cite this