Translated title of the contribution | X-ray characterization of semiconductor nanostructures |
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Original language | English |
Pages (from-to) | 064002/1- 064002/7 |
Journal | Semiconductor science and technology |
Volume | 26 |
DOIs | |
Publication status | Published - 2011 |
X-ray characterization of semiconductor nanostructures
Vaclav Holy, Maja Buljan, Rainer T. Lechner
Research output: Contribution to journal › Article › Research › peer-review
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Citation
(Scopus)