X-ray characterization of semiconductor nanostructures

Vaclav Holy, Maja Buljan, Rainer T. Lechner

Research output: Contribution to journal › Article › Research › peer-review

1 Citation (Scopus)

Translated title of the contribution	X-ray characterization of semiconductor nanostructures
Original language	English
Pages (from-to)	064002/1- 064002/7
Journal	Semiconductor science and technology
Volume	26
DOIs	https://doi.org/10.1088/0268-1242/26/6/064002
Publication status	Published - 2011

Access to Document

@article{14bca1a024484604a958d1b7d9fb6f35,

title = "X-ray characterization of semiconductor nanostructures",

author = "Vaclav Holy and Maja Buljan and Lechner, {Rainer T.}",

year = "2011",

doi = "10.1088/0268-1242/26/6/064002",

language = "English",

volume = "26",

pages = "064002/1-- 064002/7",

journal = "Semiconductor science and technology",

issn = "0268-1242",

publisher = "IOP Publishing Ltd.",

}

TY - JOUR

T1 - X-ray characterization of semiconductor nanostructures

AU - Holy, Vaclav

AU - Buljan, Maja

AU - Lechner, Rainer T.

PY - 2011

Y1 - 2011

U2 - 10.1088/0268-1242/26/6/064002

DO - 10.1088/0268-1242/26/6/064002

M3 - Article

SN - 0268-1242

VL - 26

SP - 064002/1- 064002/7

JO - Semiconductor science and technology

JF - Semiconductor science and technology

ER -