X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials

Michael B. Kerber; Michael J. Zehetbauer; Erhard Schafler; Florian C. Spieckermann; Sigrid Bernstorff; Tamas Ungar

doi:10.1007/s11837-011-0115-1

X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials

Michael B. Kerber, Michael J. Zehetbauer, Erhard Schafler, Florian C. Spieckermann, Sigrid Bernstorff, Tamas Ungar

Research output: Contribution to journal › Article › Research › peer-review

37 Citations (Scopus)

Original language	English
Journal	JOM
Volume	63
Issue number	7
DOIs	https://doi.org/10.1007/s11837-011-0115-1
Publication status	Published - 1 Jul 2011
Externally published	Yes

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10.1007/s11837-011-0115-1

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title = "X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials",

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AU - Kerber, Michael B.

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AU - Schafler, Erhard

AU - Spieckermann, Florian C.

AU - Bernstorff, Sigrid

AU - Ungar, Tamas

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JO - JOM

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X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials

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