Translated title of the contribution | X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films |
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Original language | English |
Pages (from-to) | 748-751 |
Journal | Scripta materialia |
Volume | 67 |
DOIs | |
Publication status | Published - 2012 |
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Jozef Keckes, Matthias Bartosik, Rostislav Daniel, Christian Mitterer, Günther Alois Maier, W Ecker, J. Vila-Comamala, C. David, Sebastian Schoeder, M. Burghammer
Research output: Contribution to journal › Article › Research › peer-review
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