| Translated title of the contribution | X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films |
|---|---|
| Original language | English |
| Pages (from-to) | 748-751 |
| Journal | Scripta materialia |
| Volume | 67 |
| DOIs | |
| Publication status | Published - 2012 |
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
- Jozef Keckes
- , Matthias Bartosik
- , Rostislav Daniel
- , Christian Mitterer
- , Günther Alois Maier
- , W Ecker
- , J. Vila-Comamala
- , C. David
- , Sebastian Schoeder
- , M. Burghammer
Research output: Contribution to journal › Article › Research › peer-review
84
Citations
(Scopus)