Translated title of the contribution | X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film |
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Original language | English |
Pages (from-to) | 24-31 |
Journal | Acta materialia |
Volume | 85 |
DOIs | |
Publication status | Published - 2015 |
X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
M. Steffenelli, Rostislav Daniel, W Ecker, Daniel Kiener, Juraj Todt, A. Zeilinger, Christian Mitterer, M. Burghammer, Jozef Keckes
Research output: Contribution to journal › Article › Research › peer-review
42
Citations
(Scopus)