X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

M. Steffenelli, Rostislav Daniel, W Ecker, Daniel Kiener, Juraj Todt, A. Zeilinger, Christian Mitterer, M. Burghammer, Jozef Keckes

Research output: Contribution to journalArticleResearchpeer-review

42 Citations (Scopus)
Translated title of the contributionX-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Original languageEnglish
Pages (from-to)24-31
JournalActa materialia
Volume85
DOIs
Publication statusPublished - 2015

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