Structural evolution of oxygen on the surface of TiAlN: Ab initio molecular dynamics simulations

Guo, F., Wang, J., Du, Y., Holec, D., Ou, P., Zhou, H., Chen, L. & Kong, Y. 2019 in : Applied surface science. S. 520-525

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A comparative study on NbO_x films reactively sputtered from sinterd and cold gas sprayed targets

Lorenz, R., O`Sullivan, M., Fian, A., Sprenger, D., Lang, B. & Mitterer, C. 2018 in : Applied surface science. S. 1157-1162

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Sputter deposition of Mo-based multicomponent thin films from rotatable targets : Experiment and simulation

Rausch, M., Pavlovic, M., Kreiml, P., Cordill, M. J., Winkler, J. & Mitterer, C. 2018 in : Applied surface science. 455, S. 1029-1036

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Interface and stability analysis of Tantalum- and Titanium nitride thin films onto Lithiumniobate

Vogel, U., Oswald, S. & Eckert, J. Dez 2017 in : Applied surface science. 425, S. 254-260

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Anti-adhesive layers on stainless steel using thermally stable dipodal perfluoroalkyl silanes

Kaynak, B., Alpan, C., Kratzer, M., Ganser, C., Teichert, C. & Kern, W. 2017 in : Applied surface science. 416, S. 824-833

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Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Kondratenko, S. V., Lysenko, V. S., Kozyrev, Y. N., Kratzer, M., Storozhuk, D. P., Iliash, S. A., Czibula, C. & Teichert, C. 15 Dez 2016 in : Applied surface science. 389, S. 783-789 7 S.

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Ion-bombardment induced morphology change of device related SiGe multilayer heterostructures

Hofer, C., Teichert, C., Werner, J., Lyutovich, K. & Kasper, E. 2009 in : Applied surface science. 256, S. 267-273

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Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A. 2006 in : Applied surface science. 252, S. 3342-3351

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Modification of wetting of copper (Cu) on carbon (C) by plasma treatment and molybdenum (Mo)interlayers

Eisenmenger-Sittner, C., Schrank, C., Neubauer, E., Eiper, E. & Keckes, J. 2006 in : Applied surface science. 252, S. 5343-5346

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