Neuester Forschungsoutput

• Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

• 30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiO_x thin film

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

• Evolution of structure and mechanical properties of nanocrystalline multi-layered arc-evaporated AlCrN-AlTiN coatings upon thermal loading revealed by X-ray nanodiffraction and tribological investigation

  Publikationen: Konferenzbeitrag › Poster › Forschung