Neuester Forschungsoutput

• 30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiO_x thin film

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

• Evolution of structure and mechanical properties of nanocrystalline multi-layered arc-evaporated AlCrN-AlTiN coatings upon thermal loading revealed by X-ray nanodiffraction and tribological investigation

  Publikationen: Konferenzbeitrag › Poster › Forschung

• Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)