Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Standard

Electrical properties of ZnO nanorods studied by conductive atomic force microscopy. / Beinik, Igor; Kratzer, Markus; Wachauer, Astrid; Wang, Lin; Lechner, Rainer; Teichert, Christian; Motz, Christian; Anwand, W.; Brauer, Gerhard; Chen, Xinyi; Hsu, Y. F.; Djuricis, A.

in: Journal of applied physics, Jahrgang 110, 2011, S. 052005-1-052005-7.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Author

Beinik, Igor ; Kratzer, Markus ; Wachauer, Astrid ; Wang, Lin ; Lechner, Rainer ; Teichert, Christian ; Motz, Christian ; Anwand, W. ; Brauer, Gerhard ; Chen, Xinyi ; Hsu, Y. F. ; Djuricis, A. / Electrical properties of ZnO nanorods studied by conductive atomic force microscopy. in: Journal of applied physics. 2011 ; Jahrgang 110. S. 052005-1-052005-7.

Bibtex - Download

@article{6041ff0a9e214644ba9bdd0ae6106c4d,
title = "Electrical properties of ZnO nanorods studied by conductive atomic force microscopy",
author = "Igor Beinik and Markus Kratzer and Astrid Wachauer and Lin Wang and Rainer Lechner and Christian Teichert and Christian Motz and W. Anwand and Gerhard Brauer and Xinyi Chen and Hsu, {Y. F.} and A. Djuricis",
year = "2011",
doi = "10.1063/1.3623764",
language = "English",
volume = "110",
pages = "052005--1--052005--7",
journal = "Journal of applied physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

AU - Beinik, Igor

AU - Kratzer, Markus

AU - Wachauer, Astrid

AU - Wang, Lin

AU - Lechner, Rainer

AU - Teichert, Christian

AU - Motz, Christian

AU - Anwand, W.

AU - Brauer, Gerhard

AU - Chen, Xinyi

AU - Hsu, Y. F.

AU - Djuricis, A.

PY - 2011

Y1 - 2011

U2 - 10.1063/1.3623764

DO - 10.1063/1.3623764

M3 - Article

VL - 110

SP - 052005-1-052005-7

JO - Journal of applied physics

JF - Journal of applied physics

SN - 0021-8979

ER -