Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry. / Taudt, Christopher; Nelsen, Bryan; Schlögl, Sandra; Koch, Edmund; Hartmann, Peter.

in: Proceedings / MDPI AG , Jahrgang 2.2018, Nr. 13, 1046, 2019.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Author

Taudt, Christopher ; Nelsen, Bryan ; Schlögl, Sandra ; Koch, Edmund ; Hartmann, Peter. / Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry. in: Proceedings / MDPI AG . 2019 ; Jahrgang 2.2018, Nr. 13.

Bibtex - Download

@article{525492d7d84546f584a7bdc1cbf8f472,
title = "Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry",
author = "Christopher Taudt and Bryan Nelsen and Sandra Schl{\"o}gl and Edmund Koch and Peter Hartmann",
year = "2019",
doi = "10.3390/proceedings2131046",
language = "English",
volume = "2.2018",
journal = "Proceedings / MDPI AG",
issn = "2504-3900",
publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",
number = "13",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry

AU - Taudt, Christopher

AU - Nelsen, Bryan

AU - Schlögl, Sandra

AU - Koch, Edmund

AU - Hartmann, Peter

PY - 2019

Y1 - 2019

U2 - 10.3390/proceedings2131046

DO - 10.3390/proceedings2131046

M3 - Article

VL - 2.2018

JO - Proceedings / MDPI AG

JF - Proceedings / MDPI AG

SN - 2504-3900

IS - 13

M1 - 1046

ER -