Imaging dislocations in gallium nitride across broad areas using atomic force microscopy

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Imaging dislocations in gallium nitride across broad areas using atomic force microscopy. / Bennett, S.E.; Holec, David; Kappers, M.J.; Humphreys, C.J.; Oliver, R.A.

in: Review of scientific instruments, 2010, S. 0637011-0637017.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Author

Bennett, S.E. ; Holec, David ; Kappers, M.J. ; Humphreys, C.J. ; Oliver, R.A. / Imaging dislocations in gallium nitride across broad areas using atomic force microscopy. in: Review of scientific instruments. 2010 ; S. 0637011-0637017.

Bibtex - Download

@article{30787dda3db64e09848c306cbecbfe25,
title = "Imaging dislocations in gallium nitride across broad areas using atomic force microscopy",
author = "S.E. Bennett and David Holec and M.J. Kappers and C.J. Humphreys and R.A. Oliver",
year = "2010",
doi = "10.1063/1.3430539",
language = "English",
pages = "0637011--0637017",
journal = "Review of scientific instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Imaging dislocations in gallium nitride across broad areas using atomic force microscopy

AU - Bennett, S.E.

AU - Holec, David

AU - Kappers, M.J.

AU - Humphreys, C.J.

AU - Oliver, R.A.

PY - 2010

Y1 - 2010

U2 - 10.1063/1.3430539

DO - 10.1063/1.3430539

M3 - Article

SP - 637011

EP - 637017

JO - Review of scientific instruments

JF - Review of scientific instruments

SN - 0034-6748

ER -