Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffraction

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Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffraction. / Todt, J.; Krywka, C.; Zhang, Z.L.; Mayrhofer, P.H.; Keckes, J.; Bartosik, M.

in: Acta Materialia, Jahrgang 195.2020, Nr. 15 August, 29.05.2020, S. 425-432.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{b933546ce44442e79b1bf86c2d0cb252,
title = "Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffraction",
author = "J. Todt and C. Krywka and Z.L. Zhang and P.H. Mayrhofer and J. Keckes and M. Bartosik",
year = "2020",
month = may,
day = "29",
doi = "10.1016/j.actamat.2020.05.056",
language = "English",
volume = "195.2020",
pages = "425--432",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",
number = "15 August",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffraction

AU - Todt, J.

AU - Krywka, C.

AU - Zhang, Z.L.

AU - Mayrhofer, P.H.

AU - Keckes, J.

AU - Bartosik, M.

PY - 2020/5/29

Y1 - 2020/5/29

U2 - 10.1016/j.actamat.2020.05.056

DO - 10.1016/j.actamat.2020.05.056

M3 - Article

VL - 195.2020

SP - 425

EP - 432

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

IS - 15 August

ER -