Morphology characterization and friction coefficient determination of sputtered V2O5 films

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Morphology characterization and friction coefficient determination of sputtered V2O5 films. / Klünsner, Thomas; Shen, Quan; Hlawacek, G; Teichert, Christian; Fateh, Nazanin; Fontalvo, Gerardo; Mitterer, Christian.

in: Thin solid films, Jahrgang 519, 2010, S. 1416-1420.

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

Harvard

Klünsner, T, Shen, Q, Hlawacek, G, Teichert, C, Fateh, N, Fontalvo, G & Mitterer, C 2010, 'Morphology characterization and friction coefficient determination of sputtered V2O5 films', Thin solid films, Jg. 519, S. 1416-1420. https://doi.org/10.1016/j.tsf.2010.09.040

APA

Klünsner, T., Shen, Q., Hlawacek, G., Teichert, C., Fateh, N., Fontalvo, G., & Mitterer, C. (2010). Morphology characterization and friction coefficient determination of sputtered V2O5 films. Thin solid films, 519, 1416-1420. https://doi.org/10.1016/j.tsf.2010.09.040

Vancouver

Klünsner T, Shen Q, Hlawacek G, Teichert C, Fateh N, Fontalvo G et al. Morphology characterization and friction coefficient determination of sputtered V2O5 films. Thin solid films. 2010;519:1416-1420. https://doi.org/10.1016/j.tsf.2010.09.040

Author

Klünsner, Thomas ; Shen, Quan ; Hlawacek, G ; Teichert, Christian ; Fateh, Nazanin ; Fontalvo, Gerardo ; Mitterer, Christian. / Morphology characterization and friction coefficient determination of sputtered V2O5 films. in: Thin solid films. 2010 ; Jahrgang 519. S. 1416-1420.

Bibtex - Download

@article{b801a374587d42dbabd800ea2a0d4827,
title = "Morphology characterization and friction coefficient determination of sputtered V2O5 films",
author = "Thomas Kl{\"u}nsner and Quan Shen and G Hlawacek and Christian Teichert and Nazanin Fateh and Gerardo Fontalvo and Christian Mitterer",
year = "2010",
doi = "10.1016/j.tsf.2010.09.040",
language = "English",
volume = "519",
pages = "1416--1420",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Morphology characterization and friction coefficient determination of sputtered V2O5 films

AU - Klünsner, Thomas

AU - Shen, Quan

AU - Hlawacek, G

AU - Teichert, Christian

AU - Fateh, Nazanin

AU - Fontalvo, Gerardo

AU - Mitterer, Christian

PY - 2010

Y1 - 2010

U2 - 10.1016/j.tsf.2010.09.040

DO - 10.1016/j.tsf.2010.09.040

M3 - Article

VL - 519

SP - 1416

EP - 1420

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -

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