Morphology characterization and friction coefficient determination of sputtered V2O5 films

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Morphology characterization and friction coefficient determination of sputtered V2O5 films. / Klünsner, Thomas; Shen, Quan; Hlawacek, G; Teichert, Christian; Fateh, Nazanin; Fontalvo, Gerardo; Mitterer, Christian.

in: Thin solid films, Jahrgang 519, 2010, S. 1416-1420.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{b801a374587d42dbabd800ea2a0d4827,
title = "Morphology characterization and friction coefficient determination of sputtered V2O5 films",
author = "Thomas Kl{\"u}nsner and Quan Shen and G Hlawacek and Christian Teichert and Nazanin Fateh and Gerardo Fontalvo and Christian Mitterer",
year = "2010",
doi = "10.1016/j.tsf.2010.09.040",
language = "English",
volume = "519",
pages = "1416--1420",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier BV",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Morphology characterization and friction coefficient determination of sputtered V2O5 films

AU - Klünsner, Thomas

AU - Shen, Quan

AU - Hlawacek, G

AU - Teichert, Christian

AU - Fateh, Nazanin

AU - Fontalvo, Gerardo

AU - Mitterer, Christian

PY - 2010

Y1 - 2010

U2 - 10.1016/j.tsf.2010.09.040

DO - 10.1016/j.tsf.2010.09.040

M3 - Article

VL - 519

SP - 1416

EP - 1420

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -