Morphology characterization and friction coefficient determination of sputtered V2O5 films
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Morphology characterization and friction coefficient determination of sputtered V2O5 films. / Klünsner, Thomas; Shen, Quan; Hlawacek, G; Teichert, Christian; Fateh, Nazanin; Fontalvo, Gerardo; Mitterer, Christian.
in: Thin solid films, Jahrgang 519, 2010, S. 1416-1420.Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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TY - JOUR
T1 - Morphology characterization and friction coefficient determination of sputtered V2O5 films
AU - Klünsner, Thomas
AU - Shen, Quan
AU - Hlawacek, G
AU - Teichert, Christian
AU - Fateh, Nazanin
AU - Fontalvo, Gerardo
AU - Mitterer, Christian
PY - 2010
Y1 - 2010
U2 - 10.1016/j.tsf.2010.09.040
DO - 10.1016/j.tsf.2010.09.040
M3 - Article
VL - 519
SP - 1416
EP - 1420
JO - Thin solid films
JF - Thin solid films
SN - 0040-6090
ER -